1![Microscopy: Science, Technology, Applications and Education A. Méndez-Vilas and J. Díaz (Eds.) ______________________________________________ Measuring dielectric properties at the nanoscale using Electrostatic Force M Microscopy: Science, Technology, Applications and Education A. Méndez-Vilas and J. Díaz (Eds.) ______________________________________________ Measuring dielectric properties at the nanoscale using Electrostatic Force M](https://www.pdfsearch.io/img/7547414da6bbecd098ad0cdfc00dd705.jpg) | Add to Reading ListSource URL: www.formatex.infoLanguage: English - Date: 2011-02-11 05:42:59
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2![Photon Factory Activity Report 2011 #B 7C/2009G567 XANAM with Quartz tuning fork cantilever Shushi SUZUKI*1, Shingo MUKAI2, Wang Jae CHUN4, Masaharu NOMURA3, Photon Factory Activity Report 2011 #B 7C/2009G567 XANAM with Quartz tuning fork cantilever Shushi SUZUKI*1, Shingo MUKAI2, Wang Jae CHUN4, Masaharu NOMURA3,](https://www.pdfsearch.io/img/1c245f456f460a14027bcf7baed01ecd.jpg) | Add to Reading ListSource URL: pfwww.kek.jpLanguage: English - Date: 2013-01-15 01:15:43
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3![](https://www.pdfsearch.io/img/533f9424e5434012e8299ddd0cd32829.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2011-11-12 18:00:00
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4![Nanosurf FlexAFM Your Versatile Research AFM for Materials & Life Science t Measurement capabilities in air and liquid t Versatility in applications and modes t Compatibility with inverted microscopes Nanosurf FlexAFM Your Versatile Research AFM for Materials & Life Science t Measurement capabilities in air and liquid t Versatility in applications and modes t Compatibility with inverted microscopes](https://www.pdfsearch.io/img/6cf1b4cbd2f13f66bfc61dbbc72c4a3f.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2012-03-25 18:00:00
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5![](https://www.pdfsearch.io/img/aedabe7925d0993333ca0ce7cb03f781.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2011-11-12 18:00:00
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6![](https://www.pdfsearch.io/img/de968482e581a86e8f97326021cb5991.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2011-11-27 18:00:00
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7![Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P](https://www.pdfsearch.io/img/6f77b3adee156679a5c3b7e4decf2296.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2011-11-12 18:00:00
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8![Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P](https://www.pdfsearch.io/img/a10542ab06a8967f394b971c66725a50.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2011-11-12 18:00:00
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9![AFM for biological applications
LIFE setup and measuring head lifting mechanism Development of an AFM for biological applications is always a tricky problem because it requires AFM integration with an Inverted Light Mi AFM for biological applications
LIFE setup and measuring head lifting mechanism Development of an AFM for biological applications is always a tricky problem because it requires AFM integration with an Inverted Light Mi](https://www.pdfsearch.io/img/632e974348db569f62ff494aa3cd5380.jpg) | Add to Reading ListSource URL: www.ntmdt.ruLanguage: English - Date: 2012-12-13 04:14:09
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10![Flexible integrated research AFM
OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu Flexible integrated research AFM
OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu](https://www.pdfsearch.io/img/bd8fe6e4060a705eeb7aabb7f703f516.jpg) | Add to Reading ListSource URL: www.ntmdt.ruLanguage: English - Date: 2012-12-28 07:31:35
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